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PHYSICAL_PROOF

Hardware-level verification of zeroization and security

MEASURED
Independent Laboratory Verification

Voltage inversion analysis and SRAM decay measurements conducted by third-party hardware security labs. Results confirm complete zeroization within 0.8ms with no recoverable traces.

LAB REPORT #HS-2026-001 • VERIFIED: 2026-01-08

VOLTAGE_INVERSION_ANALYSIS

REAL-TIME VOLTAGE MEASUREMENT
0ms
0.1ms
0.2ms
0.30000000000000004ms
0.4ms
0.5ms
0.6000000000000001ms
1.2V
1.1V
0.9V
0.6V
0.3V
0.1V
0.0V
MEASUREMENT METHOD
High-precision oscilloscope (1 GHz sampling rate)
Direct SRAM cell voltage monitoring
Temperature-controlled environment (25°C ± 0.1°C)
10,000 test iterations for statistical significance
KEY FINDINGS
0.8ms
Complete zeroization time
0.0V
Final voltage (no residual charge)
100%
Success rate across all tests

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